The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2001

Filed:

Sep. 11, 1998
Applicant:
Inventors:

Arttu Luukanen, Helsinki, FI;

Heikki Sipila, Espoo, FI;

Veli-Pekka Viitanen, Veikkola, FI;

Assignee:

Metorex International Oy, Helsinki, FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 3/10232 ;
U.S. Cl.
CPC ...
H01L 3/10232 ;
Abstract

The invention relates to detection performed over millimeter and submillimeter wavelengths, especially to imaging solutions functioning over a submillimeter-wavelength range. The system of the invention uses detectors, comprising antenna coupled bolometers together with wavelength selective optics. The detector matrix is preferably curved for reducing the number of imaging errors. In order to provide a curved detector matrix, the detector matrix is constituted by flat submatrices, each being provided with one or more integrated antenna coupled bolometers. The detectable frequency range is preferably limited in two stages, first by means of wavelength selective optics and secondly by means of the operating band of the antenna of an antenna coupled bolometer. In order to focus the incoming radiation on bolometers, the bolometer substrate is fitted or the surface or interior of the bolometer substrate is provided with a bolometer lens or a corresponding optical element in alignment with each bolometer.


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