The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2001
Filed:
Sep. 08, 1998
Hubert Kirrmann, Baden, CH;
Peter Terwiesch, Edingen-Neckarhausen, DE;
ABB Research Ltd., Zurich, CH;
Abstract
Specimen programs (S,) of a specimen object (,) can be tested by means of an observation tool (,), and the duration of program routines registered and evaluated. In order to achieve a better testing depth, the observation tool (,) is additionally supplied with at least one measurement and/or process signal from at least one simulated process (P′) from a real time simulator (,) or from a process (P) of a plant (,). At least one signal is transmitted from the simulated process (P′) to the observation tool (,), it being possible for this signal to be generated by the process (P) or (P′), and said signal triggering a test by the observation tool (,).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile