The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2001
Filed:
Oct. 12, 1999
Lars Sonneland, Tananger, NO;
Per-Ola Tennebo, Chiswick, GB;
Thomas Gehrmann, Hundvaag, NO;
Oyvind Yrke, Sandnes, NO;
Knut Steen Boge, Stavanger, NO;
Gunnar Berge, Randaberg, NO;
Schlumberger Technology Corporation, Houston, TX (US);
Abstract
A method is disclosed for characterizing the subsurface levels of the Earth with a greater degree of accuracy than hitherto. Seismic data samples are migrated and stacked, for example according to known techniques and then spectrum analyzed. The spectrum analysis is applied to a feature of the subsurface and, for example, a particular layer bounded by a pair of horizons would be subject to volume reflection spectral analysis. The analysis is carried out using an orthogonal base by defining the reflection signals in terms of coefficients to a set of orthogonal polynomials. Additional seismic characteristics or attributes may be directly calculated from the polynomial coefficients. These coefficients represent the characteristics of the layer to a high degree of accuracy and may be compared with spectra derived a priori (for example, synthetic spectra or previously characterized spectra) to further assist in analysis of measured seismic data.