The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2001
Filed:
Nov. 09, 1998
Chin-Yang Sun, Ukiah, CA (US);
Other;
Abstract
A method and apparatus for monitoring and reporting electrical test results for semiconductor wafer based on a knowledge base generated from user defined tables. A computer program fetches the test data from a wafer electrical tester, reads a test parameter specification table and computes various statistics for each parameter. Rules defining device failure modes are parsed to assemble boolean logic text strings. The logic is evaluated to generate boolean results. A pass/fail determination is made and the results are sent to process engineers for corrective action.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile