The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2001

Filed:

Sep. 29, 1997
Applicant:
Inventors:

Yuichi Yamashita, Kawagoe, JP;

Atsushi Maki, Hachioji, JP;

Hideaki Koizumi, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 ;
U.S. Cl.
CPC ...
A61B 5/05 ;
Abstract

Described herein is an optical measurement instrument for a living body, comprising light incident means for simultaneously applying incident light of a wavelength in a visible-infrared region to a plurality of incident positions on the surface of a subject, light detection means for simultaneously detecting lights obtained by allowing the incident light to pass through the subject, at a plurality of detection positions on the surface of the subject, and imaging means for imaging information on the inside of the subject using detected signals outputted from the light detection means. The light incident means includes light modulation means for intensity-modulating the incident light applied to the plurality of incident positions with modulation frequencies respectively different every the respective incident positions. The light detection means includes selection and detection means for selecting and detecting transmitted light components of modulation frequencies respectively different every respective detection positions from the transmitted lights relative to the plurality of detection positions.


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