The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2001

Filed:

Mar. 23, 1998
Applicant:
Inventors:

Se-hoon Son, Seoul, KR;

Euee-seon Jang, Sungnam, KR;

Jae-seob Shin, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 ;
U.S. Cl.
CPC ...
G06K 9/36 ;
Abstract

There is provided an improved scan interleaving method suitable for multipurpose encoding of binary image data, and for selectively encoding a part or the whole of object image data according to presence or absence of exceptional sampling data (ESD). In the present invention, when the pixel data of base image data and the corresponding pixel data of the object image data to be scan-interleaved are the same (in the case of predictive sampling data), no encoding is performed on the pixels of the object image data which have no ESD, thus simplifying the algorithm and system implementation. As a result, the overall encoding performance can be improved.


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