The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2001

Filed:

Jun. 18, 1998
Applicant:
Inventors:

Zhigang Fan, Webster, NY (US);

Kathy Ryall, Canbridge, MA (US);

Jeng-Nan Shiau, Webster, NY (US);

Shriram Revankar, Webster, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/34 ;
U.S. Cl.
CPC ...
G06K 9/34 ;
Abstract

A method and apparatus for segmenting image data into windows and for classifying the windows as typical image types includes making two passes through the image data. The method includes a step of making a first pass through the image data to identify windows and to record the beginning points and image types of each of the windows, and a step of making a second pass through the image data to label each of the pixels as a particular image type. The invention also includes a macro-detection method and apparatus for separating a scanline of image data into edges and image runs and for classifying each of the edges and image runs as standard image types. In the macro-detection method, image runs and edges are classified based on micro-detection results and based on image types of adjacent image runs.


Find Patent Forward Citations

Loading…