The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2001

Filed:

Jan. 11, 1999
Applicant:
Inventor:

Per-Erik Danielsson, Linköping, SE;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 ;
U.S. Cl.
CPC ...
A61B 6/00 ;
Abstract

Complete helical cone-beam scanning and non-redundant data acquisition are obtained for three-dimensional tomographic imaging of arbitrary long objects. The minimum sized two-dimensional detector window is bounded by two consecutive turns of the helix. The ray source exposes all object points during a rotation of exactly 180 degrees when seen from the points themselves. Only one-dimensional filtering is employed in the reconstruction. Rebinning to parallel beams, as seen along the axis of rotation, allows for especially simple procedures without any need for pre-weighting or magnification factors. As a special case, the invention is applicable to helical fan-beam scanning with one-dimensional detector arrays.


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