The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2001
Filed:
Jul. 28, 1998
Applicant:
Inventors:
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/46 ;
U.S. Cl.
CPC ...
H04B 3/46 ;
Abstract
A system and method for measuring jitter. One class of embodiments is particularly useful for testing the aperture jitter of a high speed Analog to Digital (A/D) converter. Aperture jitter in a Sample and Hold circuit (S/H) or in an A/D converter introduces noise into the sampled signal, which is more extreme in areas of the input waveform that have a steep positive or negative slope. The preferred embodiment allows an easy and inexpensive way to measure aperture jitter in S/H and A/D circuits. The technique can also be adapted for measuring edge jitter in digital clock signals or in analog sine wave signals.