The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2001
Filed:
Dec. 23, 1998
Shinichi Hayashi, Toshima-ku, JP;
Yasuhiro Kamihara, Hino, JP;
Olympus Optical Co. Ltd., Tokyo, JP;
Abstract
A microscopy and apparatus capable of obtaining superresolution, and a fringe projection light-cut microscopy and apparatus capable of obtaining a natural light-cut image and enabling real-time observation. At the component separating step, a plurality of modulated images of an observation object (O) are formed by subjecting the observation object (O) to spatial modulation including a plurality of modulation components while varying the component ratios of the modulation components by moving a diffraction grating (,), which modulates the observation object (O), to a plurality of different positions. The modulated images are detected with an image pickup device (,). Modulated image components corresponding to the modulation components are separated from the number of modulated images that is not less than the number of the modulation components by using linear computation. At the component demodulating step, at least one of the separated modulated image components is demodulated.