The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2001
Filed:
May. 21, 1999
Xiaohong Zhou, Houston, TX (US);
Joseph K. Maier, Milwaukee, WI (US);
Steven J. Huff, Hartland, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A technique is disclosed for determining errors in MRI sequences resulting from eddy currents generated by pulsed gradient fields. During a calibration sequence, with no phase-encoding, gradient pulses and readout sequences are applied along physical axes of a scanner and data sets are acquired for each combination. A reference data set is acquired with no gradient pulses applied. The resulting data sets are processed by one dimensional Fourier transformation, and the transformed data is analyzed to determine spatially invariant and linear gradient errors. The phase errors may be averaged for each physical axis. The technique is particularly useful in determining errors in diffusion weighted echo planar imaging sequences.