The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2001
Filed:
Jun. 17, 1999
Applicant:
Inventors:
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 ;
U.S. Cl.
CPC ...
G01L 1/24 ;
Abstract
A light intensity measurement unit can sample the light intensity of scattered light at time intervals of a certain length corresponding to two times the length of each of small equal length sections, into which a measurement area in an optical fiber is divided. A computation unit can then compute the strain and/or temperature of each of the small sections of the measurement area in the optical fiber, based on the light intensity of the scattered light measured by the light intensity measurement unit from the scattering gain coefficient of the scattered light associated with each of the small sections.