The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2001
Filed:
Dec. 14, 1998
Shunichi Kimura, Nakai-machi, JP;
Setsu Kunitake, Nakai-machi, JP;
Yutaka Koshi, Nakai-machi, JP;
Koh Kamizawa, Nakai-machi, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
An image analysis device and method that have a mechanism for exactly predicting image quality determining factors and determine a coding parameter for an input image by combining plural different image quality determining factors, which does not deteriorate the image quality of the input image and raises the compression ratio as high as possible. In the image analysis device, an image extraction unit,extracts an image area to be analyzed from an input image,. The extracted image area,is input to plural physical quantity calculating units,. Each physical quantity calculating unit,calculates a physical quantity,independently of others and each of obtained physical quantities,is input to plural image quality determining factor calculating units,. On receiving the plural physical quantities,, each of the image quality determining factor calculating units,calculates an image quality determining factor,. A coding parameter calculating unit,calculates a coding parameter based on the plural image quality determining factors,output from the plural image quality determining factor calculating units