The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2001
Filed:
Jul. 13, 1999
Thomas Flohr, Uehlfeld, DE;
Stefan Schaller, Fuerth, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In method and apparatus for the reconstruction of images of a slice of an examination subject having a slice thickness with respect to an image plane from measured values acquired by a spiral scan of the examination subject with an x-ray source rotating around the examination subject with a detector having at least one line of detector elements, measured values lying within a maximum distance from the image plane are thereby involved in the reconstruction and are weighted such that a desired functional dependency of the slice thickness on the pitch is present.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile