The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2001
Filed:
Nov. 19, 1999
Applicant:
Inventors:
Tatsuo Igushi, Miyanohigashi-machi, JP;
Yoshiaki Togawa, Miyanohigashi-machi, JP;
Assignee:
Horiba, Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/502 ;
U.S. Cl.
CPC ...
G01N 1/502 ;
Abstract
A particle distribution size measuring apparatus incorporates a detector array having a plurality of light detecting elements located on a substrate. A first group of detector elements have a plurality of sectors with a common sector angle, while at least one other detector element is positioned furthest from an optical axis and has a smaller sector angle. Each of the detector elements can be formed on a single substrate and their position and alignment have increased the efficiency of manufacturing the arrays.