The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2001
Filed:
Dec. 22, 1999
Michael L. Defeo, Somerdale, NJ (US);
Jack Denison, Bensalem, PA (US);
John M. Mikkelsen, Philadelphia, PA (US);
Peter Truong, Willow Grove, PA (US);
Kenneth W. Maier, North Wales, PA (US);
Bo Xu, Williow Grove, PA (US);
Robert J. Burgert, Bensalem, PA (US);
De La Rue International LTD, London, GB;
Abstract
A currency note condition recognition apparatus and method uses a programmed microelectronic CPU to execute program instructions stored in a PROM to read in pixel data from an optical imaging section, including LEDs and photodiodes for generating signals which can be converted to a first image of a currency note being transported along the path of travel. The CPU receives position and skew data detected by external sensors for sensing the position and skew of the note. The CPU executes the program instructions, first to assemble a first data image of pixel data representing a two-dimensional image of substantially all of the note while averaging the pixel data in groups for further processing; second, to correct the first data image based on the skew data to eliminate skew; third, to relate the first data image to a plurality of predefined data images according to a mathematical function to determine whether the first data image can be classified as matching any one of the predefined data images corresponding to a specific currency denomination; and fourth to test the note for missing material and transmissivity in order to determine note fitness.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile