The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2001

Filed:

Sep. 08, 1998
Applicant:
Inventors:

Jiin Lai, Taipei, TW;

Jyhfong Lin, Taipei, TW;

Hsin-Chieh Lin, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/300 ; G01R 2/926 ;
U.S. Cl.
CPC ...
G01R 1/300 ; G01R 2/926 ;
Abstract

A signal-testing device used with a tester for testing a first signal and a second signal includes a selected signal generator receiving first signal and second signal for generating a selected signal the state of which is changed when first signal and second signal are in specific states, and a signal selector for selectively outputting one of first and second signals in response to the selected signal state. The present invention also provides a signal-testing method including steps of a) generating a selected signal having a plurality of pulses in response to a first signal and a second signal, b) obtaining a plurality of time differences between times when two inter-adjacent respective pulses respectively reach a specific voltage, c) obtaining a plurality of absolute values between two inter-adjacent respective time differences, and d) obtaining a phase difference by dividing by 2 an average value of the absolute values.


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