The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2001
Filed:
Apr. 26, 1999
Rainer Golenhofen, Ettlingen, DE;
Bruker AXS Analytical X-Ray Systems GmbH, Karlsruhe, DE;
Abstract
An X-ray fluorescence spectrometer (,) for the analysis of a solid or liquid sample (,) arranged in a measuring position on a sample holder (,) in a compact sample chamber (,), the sample having a maximum linear extension of 1 dm, with an X-ray tube (,) projecting into the sample chamber for irradiating the sample and with a detector (,) being arranged in a detector chamber (,), wherein the detector chamber can be separated in a vacuum-tight manner from the sample chamber by means of a closing element (,), is characterized in that the sample chamber comprises a moveable wall element (,) which, in an “open” state, permits direct access to the sample (,) in its measuring position in the sample chamber (,) and, in a “closed” state, seals the sample chamber (,) with respect to the surrounding atmosphere. In this manner, the spectrometer is more compact and fabrication is considerably easier, charging of the sample chamber with a test sample is less demanding, gas exchange between the respective chambers is simplified, the operational safety of the device, in particular during the sample changing phase, is increased and maintenance and repair works of the sample chamber itself are facilitated.