The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2001
Filed:
Apr. 07, 1997
Applicant:
Inventor:
Sunao Inoue, Chigasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/02 ;
U.S. Cl.
CPC ...
G11B 5/02 ;
Abstract
All storage areas constituting a storage medium are checked for defects by successively reading and writing data. If an error that has occurred owing to the checking operation is an error for which retry is possible, the number of times this occurs is accumulated in a retrial-count storage area of a memory. A faulty storage area is detected based upon the type of error that has occurred by checking and/or the number of occurrences that have been accumulated.
Quick Actions:
Inoue, Sunao. (2001). Storage device with the ability to check for defects in same (U.S. Patent No. 6233108). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6233108
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile