The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2001
Filed:
Mar. 22, 1999
Takashi Kondo, Sakai, JP;
Hideki Tanabe, Ibaraki, JP;
Makoto Miyazaki, Itaraki, JP;
Eiichi Ide, Itami, JP;
Hiroshi Uchino, Kyoto, JP;
Toshio Norita, Osaka, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
A three-dimensional measurement device employs a slit ray projection technique to optically determine a three-dimensional image. The device offers a choice in operating modes between high-speed measurement, high-resolution measurement and large dynamic range in the depth direction, to accommodate various situations. The different modes of operation are achieved by selectively modifying one or more of the scanning speed of a projected reference beam, the readout speed of a photosensor, the line width or line spacing of the photosensor, and the number of lines per image frame.