The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2001
Filed:
Mar. 24, 2000
Applicant:
Inventors:
Charles R. Broadus, Bothell, WA (US);
Timothy N. Turner, West Jordan, UT (US);
Assignee:
Bausch & Lomb Surgical, Inc., Claremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 ;
U.S. Cl.
CPC ...
A61B 3/14 ;
Abstract
An eye measurement system (,) includes a biometric ruler (,) and an anterior segment analyzer (,) where the system (,) compares a biometric ruler measurement to an anterior segment analyzer measurement to correct for any error in the biometric ruler measurement.