The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2001

Filed:

Jul. 08, 1998
Applicant:
Inventors:

Shinya Igarashi, Naka-machi, JP;

Yasuo Makie, Mito, JP;

Kenji Ohta, Hitachinaka, JP;

Atsushi Kanke, Hitachi, JP;

Takashi Kadohiro, Hitachinaka, JP;

Chihiro Kobayashi, Naka-machi, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/68 ;
U.S. Cl.
CPC ...
G01F 1/68 ;
Abstract

In flow detection by a thermal-type flow measuring instrument, a flow rate valve with reduced measurement error due to temperature variation can be obtained even under environment where a fluid temperature and a circuit temperature are different. A measurement error due to temperature variation of the fluid of the thermal-type flow measuring instrument can be corrected on the basis of a temperature of the fluid by adjusting the measurement error to be constant ratio irrespective of the flow rate. On the other hand, a temperature characteristic of the circuit is adjusted to be substantially zero %.


Find Patent Forward Citations

Loading…