The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2001
Filed:
Aug. 26, 1999
Michael J. Martin, Boise, ID (US);
John W. Huffman, Meridian, ID (US);
Nancy Cernusak, Eagle, ID (US);
Suzie Dustin, Meridian, ID (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
In an imaging system including at least one imaging medium transfer surface, an apparatus for detecting defects on the transfer surface is provided. The apparatus includes a scanner mechanism adapted and constructed to generate signals corresponding to a condition of the transfer surface. A processor is also provided. The processor is operatively connected to the scanner mechanism, and is adapted and constructed to receive and interpret signals from the scanner mechanism. In an imaging system including at least one imaging medium transfer surface, a method of detecting defects on an image medium surface is provided. The method includes the following steps. First, a scanning mechanism is provided. The scanning mechanism is adapted and constructed to generate signals corresponding to a condition of the transfer surface within the imaging system. Next, a defect is detected on the transfer surface by analyzing the signals generated by the scanning mechanism.