The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2001

Filed:

Dec. 22, 1998
Applicant:
Inventor:

Jay M. Amos, Hobe Sound, FL (US);

Assignee:

United Technologies Corporation, Hartford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

A method and an apparatus generate a plurality of inspection signals each indicative of an internal physical characteristic of a portion of an object. Each of the inspection signals is generated with a different orientation relative to the portion of the object. A signal is generated indicative of a measure of correlation between the inspection signals. The method and the apparatus can be used to reduce the effect of noise and/or distortion in regard to inspection of objects. In one detailed embodiment, the inspection signals are x-ray images indicative of a density of an object. The x-ray images are processed to identify indications in the x-ray images that indicate a density associated with a defect. The indications in the images are then compared to each other to determine whether there is a correlation between the indications. Low correlation between the indications tends to indicate the presence of distortion in the inspection signals. High correlation between the indications indicates lack of distortion in the x-ray images. Such method and the apparatus are used to better distinguish between a portion of an x-ray indicative of distortion and a portion of an x-ray image indicative of defects, in reasonably rapid fashion, thereby making inspection of objects having relatively large, randomly oriented grains economical and practical.


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