The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2001

Filed:

Apr. 17, 2000
Applicant:
Inventor:

Robert E. Vaughan, Redondo Beach, CA (US);

Assignee:

Hughes Electronics Corporation, El Segundo, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 7/185 ;
U.S. Cl.
CPC ...
H04B 7/185 ;
Abstract

A method and apparatus for determining interference from a beam generated by a satellite includes the steps of determining a desired beam having a desired center location, a desired shape, a beam angle, and a predetermined frequency bandwidth comprising a plurality of frequencies. An acceptable interference is determined according to an acceptable side lobe signal strength. A beam squint pattern is determined that corresponds to each of the frequency widths. A beam squint boundary has an area substantially enclosing the beam squint pattern. The beam squint pattern has a center and a radius. A distance between centers is determined based upon the radii of the adjacent beams.


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