The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2001
Filed:
Sep. 08, 1997
Takefumi Namiki, Kawasaki, JP;
Fujitsu Limted, Kawasaki, JP;
Abstract
An electromagnetic wave analyzer which computes transitional behavior of electromagnetic waves, taking into account conductor losses in each metal part, without the computation being limited by the metal thickness or angular frequencies. An initialization unit initializes various calculation parameters such as metal thickness d, the number of meshes, mesh sizes, dielectric constant ∈ of each cell, permeability &mgr;, and electrical conductivity &sgr;. An analyzing unit uses a finite difference time domain method to solve a given equation under a surface impedance boundary condition in which the surface impedance z(&ohgr;) of a metal part becomes to 1/d&sgr; when the skin depth &dgr; approaches infinity (i.e., when the angular frequency &ohgr; approaches zero). The analyzing unit yields a solution that described the transitional behavior of electromagnetic waves and outputs it as a result data file. In this way, the analyzer of the present invention computes transitional behavior of electromagnetic waves, taking into account conductor losses in each metal part, without being affected by the thickness of the metal parts.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile