The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2001
Filed:
Nov. 05, 1998
Applicant:
Inventors:
Michael I. Miller, Baltimore, MD (US);
Sarang C. Joshi, St. Louis, MO (US);
Gary E. Christensen, Iowa City, IA (US);
Assignee:
Washington University, St. Louis, MI (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 ; G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/36 ; G06K 9/00 ;
Abstract
An apparatus and method for image registration of a template image with a target image with large deformation. The apparatus and method involve computing a large deformation transform based on landmark manifolds, image data or both. The apparatus and method are capable of registering images with a small number of landmark points. Registering the images is accomplished by applying the large deformation transform.
Quick Actions:
Miller, Michael. (2001). Rapid convolution based large deformation image matching via landmark and volume imagery (U.S. Patent No. 6226418). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6226418
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile