The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2001
Filed:
Jun. 29, 1999
Menno W. J. Prins, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
The invention relates to an X-ray examination apparatus for forming X-ray images of an object. An X-ray examination apparatus of this kind includes an X-ray source, an X-ray filter for adjusting the two-dimensional distribution of an X-ray beam to be generated on the object and an X-ray detector. The X-ray filter includes capillary tubes whose inner sides are provided with an electrically conductive layer and one end of which communicates with a reservoir containing an X-ray absorbing liquid. For each capillary tube the quantity of X-ray-absorbing liquid can be adjusted by way of an electric voltage applied across the inner side of the capillary tube and the X-ray absorbing liquid. The X-ray filter is arranged between the object and the X-ray source, the tubes of the X-ray filter being arranged such that the tubes of the X-ray filter are arranged such that lines through all longitudinal axes of the tubes are intersecting lines extending through the X-ray source via the X-ray filter to the X-ray detector. In this way X-rays to be generated, starting from the X-ray source travelling via the X-ray filter to different points of the detector traverse a substantial part of the X-ray absorbing liquid in at least one of the capillary tubes.