The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2001
Filed:
Jul. 23, 1999
Rudolph M. Snoeren, Eindhoven, NL;
Bartholomeus G. M. H. Dillen, Eindhoven, NL;
Willibrordus H. F. M. Van Den Meijdenberg, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
An X-ray examination apparatus comprises an X-ray detector (,) for deriving an optical image from an X-ray image. An image pick-up device (,) derives an image signal from the optical image. The image pick-up device (,) is provided with an image sensor (,) having a plurality of sensor elements. The effective surface area of the sensor elements differs for different optical spectral components of the optical image. The image pick-up device is provided with an adjusting system for selecting an optical spectral component. The image signal is derived from the selected optical spectral component.