The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2001
Filed:
Apr. 26, 1999
Rainer Golenhofen, Ettlingen, DE;
Bruker AXS Analytical X-ray Systems GmbH, Karlsruhe, DE;
Abstract
A spectrometer for the simultaneous measurement of several spectral lines from a sample (,) with several wavelength selectors (,) which supply light of a certain wavelength selectively to a detector (9), wherein each wavelength selector selects a different wavelength, is characterized in that at least two different wavelength selectors (,) can supply light from the sample (,) to the same detector (,) and that the detector (,) is energy-dispersive and has sufficiently large resolution in order to energy separate the detected light of the various wavelengths from the at least two different wavelength selectors. In this manner it is possible on the one hand to achieve the high resolution of known wavelength-dispersive arrangements with relatively short measuring times due to simultaneous measurements of different wavelength ranges and on the other hand the number of detectors and associated measurement electronics is considerably reduced without requiring in turn a considerably higher effort on the mechanical side of the apparatus.