The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2001

Filed:

May. 08, 1998
Applicant:
Inventors:

James H. Michels, Clinton, NY (US);

Muralidhar Rangaswamy, Marlborough, MA (US);

Jaime R. Román, Palm Beach Gardens, FL (US);

Dennis W. Davis, Eustis, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/46 ; H03D 1/00 ; H03D 1/04 ;
U.S. Cl.
CPC ...
H04B 3/46 ; H03D 1/00 ; H03D 1/04 ;
Abstract

Apparatus and method for improving the detection of signals obscured by either correlated Gaussian or non-Gaussian noise plus additive white Gaussian noise using Estimates from multi-channel data of model parameters that describe the noise disturbance correlation are obtained from data that contain signal-free data vectors, referred to as “secondary” or “reference” cell data. These parameters form the coefficients of a multi-channel whitening filter. A data vector to be tested for the presence of a signal passes through the multi-channel whitening filter. The filter's output is then processed to form a test statistic. The test statistic is compared to a threshold value to decide whether a signal is “present” or “absent”. Embodiments of the apparatus and method include estimating the signal amplitude both implicitly and explicitly and calculating test statistics for signal detection in both Gaussian and non-Gaussian noise.


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