The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2001
Filed:
Jun. 26, 1998
William L. Weber, Wallkill, NY (US);
GretagMacbeth LLC, New Windsor, NY (US);
Abstract
A method and system to measure surface characteristics of a specimen. One implementation involves receiving at a receiver optical radiation reflected or scattered from a specimen, the optical radiation including specular components that are spatially encoded by wavelength according to chromatic aberration of the receiver. A measure of surface characteristics is then provided by processing a signal representing the received optical radiation which includes the specular components that are spatially encoded by wavelength according to chromatic aberration. The invention may be implemented with an integrating sphere, in either SCE or SCI mode, and both color and surface effects of a specimen can be measured simultaneously using a single spectrophotometric instrument. In an alternative embodiment, the size of a port opposite a receiver is varied, and for each of a plurality of port sizes, the receiver receives a corresponding optical radiation signal representing optical radiation reflected by the sample. These optical radiation signals are processed to provide a measure of the specimen surface characteristics.