The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2001
Filed:
Nov. 06, 1998
Shu-Chieh Chang, Greenfield, WI (US);
Michael J. Rikkola, Milwaukee, WI (US);
Paul G. Phillips, Wauwatosa, WI (US);
John S. Burant, Waukesha, WI (US);
Demeng Chen, Milwaukee, WI (US);
Harnischfeger Technology, Inc., Wilmington, DE (US);
Abstract
A hoisting machine including a device supported from a structure, the device holding the material to be lifted, the structure being movable to locate the device in respective loaded and unloading positions, and apparatus for measuring the quantity of material delivered by the device, the apparatus comprising means to determine the position of the device with respect to a selected location in the structure at a plurality of intervals during the movement of the device, means to provide a processable position signal indicative of the determined position of the device, means to determine the load at a selected location within the structure where the load is related to the weight of the device and device contents at the intervals during the movement of the device, means to produce a processable load signal indicative of the determined load at the location, and processing means to receive the position and load signals for a plurality of interval determinations and calculate therefrom a number of weight determinations of the device and device contents from the interval determinations made during the movement, to select a sample of less than all of the weight determinations based upon the dynamic influences on the machine when the signals are processed, and to average the sample of selected weight determinations to provide a final weight determination of the device and device contents.