The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2001
Filed:
Feb. 27, 1998
Stephen Silva, Fort Collins, CO (US);
Michael S. Allison, Fort Collins, CO (US);
Fred Sprague, Aloha, OR (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
The present invention comprises a testing system for testing X Servers. The testing system comprises a test harness that communicates with an X Server being tested to obtain the test results therefrom, an archive database for storing test archives to be used by the test harness for testing the X Server, a test result storage database for storing results of an X Server test, and a viewing tool that presents the user with a result file which the user analyzes to determine the X Server defect. Preferably, the test harness is object-oriented code that has a polymorphic and hierarchical structure. The basic units of the test harness are objects, such as display connections, screens, graphics contexts, pixmaps, colormaps and windows. Within the test context, each object encodes a unique hierarchy that indicates its dependencies on other test harness objects. These objects encapsulate Xlib routines and hide much of the detail of Xlib programming from the test writer, thus facilitating the test writer in writing tests. Once a test has been written, the test is run and the results of the test, if they are correct, are stored as an archive file in the test archive storage database for later use. When a test is run on an X Server, the test harness captures the image rendered to the screen by the X Server. The test harness then searches the archive database in a predetermined manner to obtain the appropriate test archive. The test archive is then compared to the test results. If the test failed, then a defect exists in the X Server.