The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2001
Filed:
Jan. 28, 1999
Takuya Sakaguchi, Tochigi, JP;
Akira Tsukamoto, Tochigi, JP;
Masayuki Nishiki, Tochigi, JP;
Naoto Watanabe, Tochigi, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
Pixel data in a region of a flat panel detector is obtained and displayed. For example, pixel data in a region irradiated with X-ray is obtained and displayed. The region to be irradiated with-the X-ray is estimated according to a degree of opening of an X-ray beam limiting device and a distance between the X-ray beam limiting device and the flat panel detector. Further, it can be determined from pixel data value of the flat panel detector also. A region of a patient can be also determined from the pixel data. Thus, an image corresponding to the entire flat panel detector, an image corresponding to an X-ray irradiation region and an image corresponding to a patient region can be displayed. A resolution for obtaining the pixel data is changed corresponding to the size of a region in the flat panel detector whose pixel data should be obtained and a processing resolution of an image processing means at post step. Particularly in an X-ray diagnostic apparatus of bi-plane structure, an observation region can be traced flexibly.