The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2001
Filed:
Mar. 12, 1999
Hendrik J. Meulenbrugge, Eindhoven, NL;
Peter L. Alving, Eindhoven, NL;
Johannes A. Luijendijk, Eindhoven, NL;
Johannes J. Stouten, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
An X-ray examination apparatus utilizes an image sensor matrix for picking up an X-ray image, i.e. for converting incident X-rays into electric charges. The X-ray examination apparatus includes a control circuit for controlling the image sensor matrix so as to form a dark signal. The X-ray examination apparatus also includes a correction unit which is arranged to derive the electronic image signal from the primary image and the dark signal. The electronic image signal represents image information in the X-ray image and has not been disturbed by electric charges which have been read with a delay.