The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2001
Filed:
Sep. 08, 1999
Applicant:
Inventors:
Akio Kimura, Tokyo-to, JP;
Ikuo Ishinabe, Tokyo-to, JP;
Assignee:
Kabushiki Kaisha Topcon, Tokyo-to, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G20B 2/714 ; G00B 2/712 ; G01C 3/08 ; G01C 2/102 ; G01N 2/186 ;
U.S. Cl.
CPC ...
G20B 2/714 ; G00B 2/712 ; G01C 3/08 ; G01C 2/102 ; G01N 2/186 ;
Abstract
The present invention provides an automatic survey instrument, which comprises an objective lens, a focusing lens, and optical means positioned between the objective lens and the focusing lens, all of the components being arranged on an optical axis, wherein the optical means comprises a first reflection surface at least for transmitting visible light and a second reflection surface at least for transmitting light at a predetermined wavelength, and reflection light from the first reflection surface reaches the second reflection surface and reflection light from the second reflection surface runs perpendicularly to the optical axis.