The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2001
Filed:
Jan. 07, 1999
Koichi Terauchi, Toyohashi, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
This spectral characteristic measuring apparatus measures two-dimensional spectral characteristics of a sample, and the apparatus includes a collimator lens, band-pass filters, lenses and an area sensor, which are arranged in order on an optical axis L. The collimator lens transforms light outputted from the sample into a pencil of parallel light. The band-pass filters have mutually-different passbands. The lenses have an identical focal distance and are arranged in correspondence with the band-pass filters. The area sensor is arranged at the focal points of the lenses and constructed of a number of imaging devices such as CCDs arranged two-dimensionally. As described above, the images spectrally separated by the band-pass filters are formed in mutually-different positions on the area sensor. Therefore, the two-dimensional spectral characteristics of the sample can be simultaneously measured with the simple construction.