The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2001

Filed:

Jun. 07, 1995
Applicant:
Inventor:

Mark T. Kern, Goleta, CA (US);

Assignee:

Raytheon Company, Lexington, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 3/700 ;
U.S. Cl.
CPC ...
H01L 3/700 ;
Abstract

A thermopile radiation detector (,) has an optical filter layer (,) that supports a thermopile detector (,) and, in addition, filters undesired wavelengths. The filtering is accomplished by selectively absorbing electromagnetic radiation at predetermined wavelengths. The use of the thermopile radiation detector simplifies the overall construction of a system that incorporates the detector by eliminating one focal point in the optical system. By altering the filter material, the number of layers of filter material, etc., a plurality of detectors can be constructed, each responsive to a different wavelength. In forming the detector, the filter can be deposited on a thin backing material such as aluminum. Examples of suitable filter materials include alternating layers of zinc selenide/magnesium fluoride or germanium/magnesium fluoride. After the filter is deposited, the backing is etched away and suitable thermocouples, such as bismuth/antimony, are deposited on one side of the filter. Incident radiation is directed to the reverse side of the filter for selective absorption and detection.


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