The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2001

Filed:

Jan. 15, 1999
Applicant:
Inventors:

David Kenneth Marti, Suffield, CT (US);

Gene Joseph Descant, Feeding Hills, MA (US);

Steven M. Craig, Terryville, CT (US);

Assignee:

CE Nuclear Power LLC, Windsor, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/904 ;
U.S. Cl.
CPC ...
G01N 2/904 ;
Abstract

A surface scanner for conducting non-destructive inspection of complex surface structures and configurations. The scanner includes two flexible tracks, each fitted with a motor driven tractor assembly. A rigid beam track spans the two flexible tracks. The rigid beam track is coupled to each flexible track tractor assembly by articulating joints that permit movement at the joints along at least three independent axes. The rigid beam supports a third motorized tractor. This third tractor supports a compliant thruster assembly that deploys gimbaled mechanical impedance, ultrasonic and eddy current inspection probes. The movement of the scanner is controlled by a scan control system that includes both hardware and software for controlling the movement of the scanner over the surface to be inspected. The software also includes a teach mode that permits an operator to preprogram the scan pattern for the surface to be inspected using a global coordinate system, referencing points on the surface and the data display using an identical coordinate system. The scanner also includes a data acquisition and analysis system that control scanner functions and operations.


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