The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2001
Filed:
Mar. 01, 1999
Amos Noy, Jerusalem, IL;
Verisity Ltd., Rosh Haayin, IL;
Abstract
The method of the present invention determines constraints which should be applied to data structures, and then applies the constraints during the test generation process. The constraint is applied according to an internal logical order of application. Each constraint of the sequence of constraints is defined. Then a constraint is applied to a data structure for at least reducing the range of possible values, even the possible values are not restricted to one such value. This process is then repeated for other constraints in the sequence. The first constraint in the sequence or at least an earlier constraint in the sequence, is then re-applied, in order to further restrict the range of possible values, and so forth. During this process, preferably the order of suitable application is also determined, such that a constraint which cannot be applied because it requires values which have not yet been defined, is only applied after other constraint(s) which supply the missing values. The process is preferably repeated until no further restrictions can be placed on the range of potential values, more preferably until one such value is determined if possible.