The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2001
Filed:
Sep. 15, 1998
Wendell Davis Jones, Cary, NC (US);
Stephen J. Aud, Cary, NC (US);
John P. Hudepohl, Chapel Hill, NC (US);
Martin L. Flournory, Raleigh, NC (US);
William B. Snipes, Cary, NC (US);
Eric C. Schutz, Durham, NC (US);
Nortel Networks Limited, Montreal, CA;
Abstract
A method and system for assessing risks associated with software systems include the steps of dynamically retrieving, from a plurality of external database systems, a set of risk factor data associated with the components of the software systems, and determining risk values of the components, respectively, based on a predefined risk model and the retrieved risk factor data. The retrieved risk factor data represents a multi-dimensional view of the potential risks associated with the components, and may include two or more of code complexities, architectural relationships, fault histories, development activities, designer profiles, component contention, and/or usage profiles of the software components. The risk model includes a set of risk relations that associate the retrieved risk factor data with the risk values of the components. The risk relations may be defined by correlating historical risk factor data with actual risk measurements of the components using statistical or other quantitative methods. Alternatively, the risk relations may be defined by a set of rules, which associate the retrieved risk factor data with the risk values of the components.