The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2001

Filed:

May. 12, 1998
Applicant:
Inventor:

Takefumi Namiki, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G06F 1/710 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G06F 1/710 ;
Abstract

A simulator apparatus for a combined simulation of electromagnetic wave analysis and circuit analysis, which is configured to produce stable solutions with a smaller amount of processing loads. An electromagnetic wave analyzer calculates magnetic field at a simulation time t,01 and then electric field at another simulation time t,02 thereby performing a transient analysis of electromagnetic waves. A circuit analyzer solves the given circuit equation at still another simulation time t,that is incremented by a variable time step size &Dgr;t,determined in accordance with the circumstances. A current source data transfer unit compares t,01 and t,, and if their difference falls below a time difference threshold &lgr;1, it calculates current source data for the equivalent circuit, based on the magnetic field obtained by the electromagnetic wave analyzer. The current source data transfer unit then transfers the resultant current source data to the circuit analyzer. An electric field data transfer unit, on the other hand, compares t,02 and t,, and if their difference falls below a time difference threshold &lgr;2, it calculates electric field data for the circuit's local space, based on the voltage obtained by the circuit analyzer. The resultant electric field data is then transferred to the electromagnetic wave analyzer.


Find Patent Forward Citations

Namiki, Takefumi. (2001). Apparatus for combined simulation of electromagnetic wave analysis and circuit analysis, and computer-readable medium containing simulation program therefor (U.S. Patent No. 6219629). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6219629

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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