The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2001
Filed:
Mar. 29, 1999
Brian A. Hargreaves, Stanford, CA (US);
Dwight G. Nishimura, Palo Alto, CA (US);
Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
A new technique for imaging a material with a high T2/T1 ratio such as articular cartilage uses driven equilibrium Fourier transform (DEFT), a method of enhancing signal strength without waiting for full T1 recovery. Compared to other methods, DEFT imaging provides a good combination of bright cartilage and high contrast between cartilage and surrounding tissue. Both theoretical predictions and images show that DEFT is a valuable method for imaging articular cartilage when compared to spoiled gradient recalled acquisition in the steady-state (SPGR) or fast spin echo (FSE). T2-decay, T1 recovery, echo time, magnetization density, proton density, and equilibrium density per proton are related by a derived equation.