The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2001

Filed:

Nov. 16, 1999
Applicant:
Inventor:

Nobuhiko Tanaka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 1/604 ;
U.S. Cl.
CPC ...
G11C 1/604 ;
Abstract

The reliability of data read out from a flash EPROM is improved. The flash EPROM increases the reliability of stored data. A plurality of memory areas (,) includes a first memory (,) and a second memory area (,). Sense amplifiers (,-,-,) are provided for the first and second memory areas (,). A comparing device (,) is for comparing the data read out from the first and second memory areas (,). A controlling device (,) selects either of the normal mode for independent utilization of the first and second memory areas (,) and the high reliability mode for simultaneous utilization of the first and second memory areas (,). In the high reliability mode, the controlling device (,) controls the first and second memory areas (,) to store identical data, and controls the comparing device (,) a) to compare the data read out from the first and second memory areas (,), and b) to output the data to the outer circuit, when the read out data are identical to each other.


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