The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2001
Filed:
Sep. 24, 1998
Ronald S. Scharlack, Brookline, MA (US);
James J. Childs, Franklin, MA (US);
Bayer Corporation, East Walpole, MA (US);
Abstract
A method of performing analysis of samples having turbidity and/or high absorbance is disclosed. The analysis utilizes information from multiple factors, which affect transmittance or absorbance. These factors include: absorbance as measured in a non-turbid sample, scattering losses due to particles and limitations of the measurement device as measured in a non-absorbing sample, additional scattering losses due to sample absorbance, variable path length effects due to the sample, variable path length effects due to the measurement device, and additional nonlinear effects. By taking into account additional factors that affect transmittance or absorbance, a more accurate analysis is achieved.