The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2001
Filed:
Oct. 30, 1997
Applicant:
Inventors:
Tadashi Iokibe, Shizuoka, JP;
Yasunari Fujimoto, Tokyo, JP;
Assignee:
Kabushiki Kaisha Meidensha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/00 ;
U.S. Cl.
CPC ...
G06N 5/00 ;
Abstract
Described are method and apparatus for discriminating whether a time series data is a deterministic chaos or a stochastic chaos. In the method and apparatus, a trajectory parallel measuring method is used to discriminate the observed time series data.
Iokibe, Tadashi. (2001). Apparatus and method for discriminating a time series data (U.S. Patent No. 6216118). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6216118
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile