The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2001

Filed:

Oct. 30, 1997
Applicant:
Inventors:

Yasuo Saito, Nishinasuno-machi, JP;

Katsuyuki Taguchi, Nishinasuno-machi, JP;

Hiroshi Aradate, Otawara, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/300 ;
U.S. Cl.
CPC ...
G01N 2/300 ;
Abstract

An X-ray CT scanner for producing a CT image of a subject by scanning an X-ray fan beam radiated an X-ray source through the subject in a predetermined slice-thickness direction. The scanner comprises a main detector detecting the X-ray beam to produce an X-ray transmission data of a subject and to a plurality of slices in agreement with unequal segment pitches. The detector comprises a two-dimensional array consisting of a plurality of X-ray detecting elements receiving the X-ray beam and being disposed in the slice-thickness direction as a row line and a channel direction as a column line. The X-ray detection sensitivity distributions of all the segments formed by the detecting elements disposed in predetermined element pitches in the slice-thickness direction are adjusted to be uniform or approximately uniform by controlling various members, devices, or factors which are all controllable for X-ray detection sensitivity, thereby enabling the X-ray transmission data of unequal slice thicknesses to be adjusted in sensitivity slice by slice in the detector. The scanner further comprises a switch group selecting and combining the sensitivity-adjusted X-ray transmission data of the plurality of slices, the selected and combined X-ray transmission data being provided to selected ones of a data acquiring elements of a data acquisition system.


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