The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2001

Filed:

Mar. 19, 1998
Applicant:
Inventors:

Krishna Balachandran, Middletown, NJ (US);

Sanjiv Nanda, Plainsboro, NJ (US);

Srinivas R. Kadaba, Chatham, NJ (US);

Richard P. Ejzak, Wheaton, IL (US);

Assignee:

Lucent Technologies, Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 2/302 ;
U.S. Cl.
CPC ...
H04L 2/302 ;
Abstract

A system and method to measure channel quality in terms of signal to interference plus noise ratio for the transmission of coded signals over fading channels in a communication system. A Viterbi decoder metric for the Maximum Likelihood path is used as a channel quality measure for coherent and non-coherent transmission schemes. This Euclidean distance metric is filtered in order to smooth out short term variations. The filtered or averaged metric is a reliable channel quality measure which remains consistent across different coded modulation schemes speeds. The filtered metric is mapped to the signal to interference plus noise ratio per symbol using a threshold based scheme. Use of this implicit signal to interference plus noise ratio estimate is used for the mobile assisted handoff in a cellular system, power control and data rate adaptation in the transmitter.


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