The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2001

Filed:

Apr. 20, 2000
Applicant:
Inventors:

Bin Li, Fairfax, VA (US);

Livia L. Zien, Fredericksburg, VA (US);

David C. Lawson, Fredericksburg, VA (US);

Tatia B. Butts, Manassas, VA (US);

Tri M. Hoang, Clifton, VA (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 1/100 ;
U.S. Cl.
CPC ...
G11C 1/100 ;
Abstract

A single event upset hardened multiport memory cell to be utilized in a register file is disclosed. The single event upset hardened multiport memory cell includes a storage cell, a write bitline, a read bitline. The storage cell, which is utilized for storing data, includes first and second sets of cross-coupled transistors and first and second sets of isolation transistors. The first and second sets of isolation transistors are respectively coupled to the first and second set of cross-coupled transistors such that two inversion paths are formed between the two sets of cross-coupled transistors and the two sets of isolation transistors. Coupled to the storage cell, the write bitline inputs write data to the storage cell. Also coupled to the storage cell, the read bitline outputs read data from the storage cell.


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